CSP Chip Component Visual Inspection Machine
Based on optical detection technology, this CCD-based chip component appearance inspector analyzes captured images to complete automatic inspection and loading/unloading. It stably and accurately detects surface defects, replacing traditional manual microscopic inspection, and helps manufacturers enhance quality, boost efficiency and reduce costs.
Main parameters of the equipment
Inspection Items: White spots, stains, scratches and dirt on upper & lower glass surfaces; glass edge chipping, glue overflow, cutting offset, delamination; horizontal or diagonal rainbow stripes in imaging area, and other defects.
